Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler
Features |
Benefits |
Active temperature control | Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. |
50W TEC Controller | Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. |
Fully digital P-I-D control | Provides greater temperature stability and can be easily upgraded with a simple firmware change. |
Autotuning capability for the thermal control loop (2510-AT) | Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. |
Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) | Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. |
Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors | Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. |
AC Ohms measurement function | Verifies the integrity of the TEC device. |
4-wire open/short lead detection for thermal feedback element | Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage. |
Sinetec Technologies
Tel: 04222446162