Keithley Optical SourceMeter Instruments

Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.

2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler





Active temperature control Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems.
50W TEC Controller Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions.
Fully digital P-I-D control Provides greater temperature stability and can be easily upgraded with a simple firmware change.
Autotuning capability for the thermal control loop (2510-AT) Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients.
Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) Covers most of the test requirements for production testing of cooled optical components and sub-assemblies.
Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors Works with the types of temperature sensors most commonly used in a wide range of laser diode modules.
AC Ohms measurement function Verifies the integrity of the TEC device.
4-wire open/short lead detection for thermal feedback element Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage.


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      Sinetec Technologies
      Tel: 04222446162