Keithley meets these and other important challenges in critical applications across the workflow with both High Speed Production Solutions and Fully Customizable Test Solutions.
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Today’s analog and power semiconductor technologies, including wide bandgap devices such as GaN and SiC, require parametric testing that maximizes measurement performance, enables faster time-to-market, supports a wide product mix, and minimizes the cost of test.
Applications include Semiconductor Process Control Monitoring (PCM), TEG Test, and Die Sort
Sinetec Technologies
Tel: 04222446162