Keithley Parametric Test Systems

Keithley meets these and other important challenges in critical applications across the workflow with both High Speed Production Solutions and Fully Customizable Test Solutions.



Today’s analog and power semiconductor technologies, including wide bandgap devices such as GaN and SiC, require parametric testing that maximizes measurement performance, enables faster time-to-market, supports a wide product mix, and minimizes the cost of test.

High Speed Production Test Solutions

Applications include Semiconductor Process Control Monitoring (PCM), TEG Test, and Die Sort

  • Parallel Test capability maximizes test throughput
  • Measure from kV to fA in a single probe touchdown to further boost productivity
  • ISO-17025 System-level calibration
  • Smooth migration from legacy test systems, including probe card re-use
  • Low Cost-of-Ownership (COO)


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      Sinetec Technologies
      Tel: 04222446162