Keithley Parametric Test Systems
Keithley meets these and other important challenges in critical applications across the workflow with both High Speed Production Solutions and Fully Customizable Test Solutions.
Description
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Today’s analog and power semiconductor technologies, including wide bandgap devices such as GaN and SiC, require parametric testing that maximizes measurement performance, enables faster time-to-market, supports a wide product mix, and minimizes the cost of test.
High Speed Production Test Solutions
Applications include Semiconductor Process Control Monitoring (PCM), TEG Test, and Die Sort
- Parallel Test capability maximizes test throughput
- Measure from kV to fA in a single probe touchdown to further boost productivity
- ISO-17025 System-level calibration
- Smooth migration from legacy test systems, including probe card re-use
- Low Cost-of-Ownership (COO)
Enquiry
Sinetec Technologies
Tel: 04222446162